Tracks high-energy particle activity impacting critical spacecraft nodes, which could cause SEU or be induced by adversaries using targeted energy emissions. Detects high-energy particle activity near sensitive spacecraft components.
| ID | Name | Description | |
| EX-0007 | Trigger Single Event Upset | Threat actors may utilize techniques to create a single-event upset (SEU) which is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a spacecraft(i.e., microprocessor, semiconductor memory, or power transistors). The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). This can cause unstable conditions on the spacecraft depending on which component experiences the SEU. SEU is a known phenomenon for spacecraft due to high radiation in space, but threat actors may attempt to utilize items like microwaves to create a SEU. | |