High Energy Particle Strike on Sensitive Node

Tracks high-energy particle activity impacting critical spacecraft nodes, which could cause SEU or be induced by adversaries using targeted energy emissions. Detects high-energy particle activity near sensitive spacecraft components.

STIX Pattern

[x-opencti-radiation-sensor:energy_level > 'threshold' AND x-opencti-radiation-sensor:node_location = 'critical_component']

SPARTA TTPs

ID Name Description
EX-0007 Trigger Single Event Upset Threat actors may utilize techniques to create a single-event upset (SEU) which is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a spacecraft(i.e., microprocessor, semiconductor memory, or power transistors). The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). This can cause unstable conditions on the spacecraft depending on which component experiences the SEU. SEU is a known phenomenon for spacecraft due to high radiation in space, but threat actors may attempt to utilize items like microwaves to create a SEU.
EX-0018 Non-Kinetic Physical Attack A non-kinetic physical attack is when a satellite is physically damaged without any direct contact. Non-kinetic physical attacks can be characterized into a few types: electromagnetic pulses, high-powered lasers, and high-powered microwaves. These attacks have medium possible attribution levels and often provide little evidence of success to the attacker.* *https://aerospace.csis.org/aerospace101/counterspace-weapons-101