Use Error Detection and Correcting (EDAC) memory and integrate EDAC scheme with fault management and cyber-protection mechanisms to respond to the detection of uncorrectable multi-bit errors, other than time-delayed monitoring of EDAC telemetry by the mission operators on the ground. The spacecraft should utilize the EDAC scheme to routinely check for bit errors in the stored data on board the spacecraft, correct the single-bit errors, and identify the memory addresses of data with uncorrectable multi-bit errors of at least order two, if not higher order in some cases.
| ID | Name | Description | |
| EX-0007 | Trigger Single Event Upset | Threat actors may utilize techniques to create a single-event upset (SEU) which is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a SV (i.e., microprocessor, semiconductor memory, or power transistors). The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). This can cause unstable conditions on the SV depending on which component experiences the SEU. SEU is a known phenomenon for SV due to high radiation in space, but threat actors may attempt to utilize items like microwaves to create a SEU. | |
| ID | Description |