Tracks high-energy particle activity impacting critical spacecraft nodes, which could cause SEU or be induced by adversaries using targeted energy emissions. Detects high-energy particle activity near sensitive spacecraft components.
| ID | Name | Description | |
| EX-0007 | Trigger Single Event Upset | The attacker induces or opportunistically exploits a single-event upset (SEU), a transient bit flip or latch disturbance in logic or memory, so that software executes in a state advantageous to the attack. SEUs arise when charge is deposited at sensitive nodes by energetic particles or intense electromagnetic stimuli. An actor may time operations to coincide with natural radiation peaks or use artificial means from close range. Outcomes include corrupted stacks or tables, altered branch conditions, flipped configuration bits in FPGAs or controllers, and transient faults that push autonomy/FDIR into recovery modes with broader command acceptance. SEU exploitation is probabilistic; the technique couples repeated stimulation with careful observation of mode transitions, watchdogs, and error counters to land the system in a desired but nominal-looking state from which other actions can proceed. | |
| EX-0018 | Non-Kinetic Physical Attack | The adversary inflicts physical effects on a satellite without mechanical contact, using energy delivered through the environment. Principal modalities are electromagnetic pulse (EMP), high-power laser (optical/thermal effects), and high-power microwave (HPM). These methods can be tuned for reversible disruption (temporary sensor saturation, processor upsets) or irreversible damage (component burnout, optics degradation), and may be executed from ground, airborne, or space platforms given line-of-sight and power/aperture conditions. Forensics are often ambiguous: signatures may resemble environmental phenomena or normal degradations, and confirmation of effect is frequently limited to what the operator observes in telemetry or performance loss. | |